Caltech - GPS Division Analytical Facility

High Resolution Analytical Scanning Electron Microscope:

from Nano-imaging to Chemical and Structural Analyses

ZEISS 1550VP Field Emission SEM - Oxford EDS - HKL EBSD


Information for SEM Users   |   Manual  


Imaging capabilities   

Chemical analysis - EDS         

Structural analysis - EBSD                  

Image Album

High resolution image revealing nano-crystals covering up Fe oxide particle. (c) Chi Ma

Low voltage SE image (obtaining at 300 V) showing surface details of kaolinite plates. (c) Chi Ma

Cathodoluminescence (CL) image of benitoite. (c) Chi Ma

STEM image of borosilicate fibers. (c) Chi Ma

Electron backscatter diffraction pattern of silicon.

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