Field Emission Electron Probe Microanalyzer:
JEOL JXA-iHP200F with Probe for EPMA |
A new JXA-iHP200F Field Emission EPMA is being installed at the GPS Division Analytical Facility right now from July 19, 2022. It is a state of the art, top of the line, research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. The new probe being interfaced with the latest Probe for EPMA software provides full digital-control for more reliable and automated WDS microanalysis and digital imaging.
Most of the periodic table can in principle be analyzed (Be through U). The analytical sensitivity ranges from a low of a few parts per million for optimum cases, to a typical detection limit of several hundred ppm. The volume sampled is typically a few cubic microns, corresponding to a weight of a few picograms. A precision approaching 0.X% relative and accuracy as good as 1-2% can be obtained.
Hopefully, this new probe will become available for general use in late 2022. The new probe is acquired by the NSF and Caltech funds to replace the JEOL 8200 probe at Caltech.
WDS Fe X-ray map of Martian Fe-sulfide and pyroxene by JXA-iHP200F © Chi Ma